Emerix FAI (Auto LCR Technique)
The Emerix FAI is a fully automated First Article Inspection system designed for precise measurement of inductance (L), capacitance (C), resistance (R), and diode (D) values on PCBs and assemblies. It eliminates the need for special fixtures, supports tiny SMT components such as 0201/0603, and allows quick program setup within minutes. The system delivers fast and accurate inspection results, which can be exported in CSV format and integrated with MES systems for complete traceability. Ideal for NPI and quality verification, it helps manufacturers ensure product reliability and reduce setup time before mass production.
EMERIX DIGITAL MEASUREMENT SYSTEM
Automated First Article Inspection (FAI)
– MES Ready
– Retry Test
– Speed Control
– Auto Alignment
– Optimize Route
– Fail Visualizer
– CSV Format Result
– Library Available
– Fast Program Creation
– No Fixture of Jig Required
– Optional for Diode Inspection